2002.9-2004.6,Institute of Automation, Chinese Academy of Sciences, assistant professor
2004.6-,Institute of Automation, Chinese Academy of Sciences,associate professor
R&D Scopes
Testing methods of ASIC
Design of ASIC testing system
Design of DSP testing and burn-in system
Professional Experience
2004.6-,associate professor of Institute of Automation, Chinese Academy of Sciences,
2008.6-,director of Testing Center of National Engineering & Technology Research Center for ASIC Design
Academic Achievements
Successfully testing of several high performance floating-point DSP SOC chips in the past 7 years.Design of testing system and burn-in system of several high performance DSP. As chief designer in all projects.
Current Research
Testing methods of High-Performance DSP chips.
Design of testing system of High-Performance DSP chips
Design of burn-in system of High-Performance DSP chips